SUMMIT-3100

Innovating semiconductor testing, JHT Design shapes tomorrow's technology

Explore our cutting-edge integrated circuit test handlers designed to exceed industry standards. Discover how our advanced machines can elevate your semiconductor testing needs and shape the future of technology. Join us in pioneering excellence with JHT Semi Conductor Company Limited.

SUMMIT-3100

System Level Test Handler

The Summit Series sets the benchmark for system-level semiconductor testing, offering unmatched flexibility and precision with its independent site connectivity and versatile temperature control options

Our SLT Handler offers normal, high, and low temperature models with Automatic Temperature Control (ATC), ensuring precise temperature management for diverse testing needs.

Choose from 6, 8, 12, or 16-site models, each with independent connectivity to the test system, providing tailored solutions for various testing requirements.

Each site on our SLT Handler is independently connected to the test system, enabling simultaneous testing of multiple semiconductor devices for enhanced efficiency and accuracy.

  • Test Site Quantity

    6/12/16 (Base on Different Model)

  • Temp type

    Ambient&High-Temp

  • UPH

    Max.18009(12site)

  • Index Type

    Min.4s

  • Contact Force

    MAX.120KG/site

  • Rotator Function

    90°,180°,-90°

  • Test Board Dimension

    6 site: Max 568mmx500m,12 site: Max 290mmx500m, 16site: Max 206mmx500mm

  • PKG Type

    QFN,QFP,BGA,LGA,PLCC,PGA, CSP,TSOP etc

  • PKG Size

    From 4x4 to 100x100 mm

  • Jam Rate

    <1 /5000

  • Tray Type

    Jedec tray

  • Temp Range

    25°C to +130°C ±3°C /
    77°C to +266°F ±37.4°F

  • Temperature accuracy

    ±1°C /±33.8°F

  • Num Of Sorting

    Auto Tray×4

  • Multi Bin Module (Option: +Multi Bin Module)

    Auto Tray×2；Fix Tray×15

  • Tester Interface

    RS-232，Network

  • Heating Rate (Option: +ATC)

    Ambient~125℃/257°F < 60s

  • Cooling Rate (Option: +ATC)

    125~Ambient< 120s

  • Heat Dissipation (Option: +ATC)

    200W@25℃，400W@70℃，450W@125℃(Contact size: 40 x 40mm)

  • Heating Rate (Option: +Tri-temp)

    Min.4s

  • Cooling Rate (Option: +Tri-temp)

    Ambient~125℃ < 15min

  • Heat Dissipation (Option: +Tri-temp)

    150W@-55℃，400W@25℃，400W@125℃(Contact size: 65 x 65mm)

All Products

KEY FEATURES

Independent Site Connectivity

Simultaneously test multiple semiconductor devices for optimized throughput.

Versatile Temperature Control

Precisely manage temperature across various conditions for accurate testing.

Benchmark for System-Level Testing

Sets industry standards, providing comprehensive and reliable testing solutions.