At JHT, we specialize in delivering professional and scalable testing solutions designed for a diverse array of semiconductor applications. Discover our Neoceed, Summit, and Collie series, each meticulously crafted to deliver dependable performance tailored precisely to your requirements. All our test handlers are equipped to efficiently to handle 2mm x 2mm package testing. For more details, please download the PDF provided below.
Tri-Temperature Machine
Jam Rate < 1/ 10,000 pcs
Pick and Place
EXCEED 9800 PnP Handler
The EXCEED‑9800 Series Pick‑and‑Place Handler is designed to support IC testing and sorting across ambient, hot, and cold temperature environments. Equipped with an advanced ATC (Active Temperature Control) system, it delivers high‑precision and stable temperature control throughout the test process, ensuring accurate results and reliable performance in high‑volume production.
A high‑performance IC test handler designed for functional testing, delivering exceptional throughput and rock‑solid stability. With support for up to 32‑site parallel testing and sorting under ambient and hot temperature conditions, it enables manufacturers to maximize test efficiency and optimize high‑volume production.
High‑throughput IC test handler designed for functional testing, delivering stable, production‑ready performance with up to 16‑site parallel testing and sorting under ambient and hot temperature conditions.
The EXCEED‑6000 Series PnP Handler enables fast, stable functional IC testing with ambient and hot temperature support and 8‑site parallel sorting for maximum efficiency.
The Tube Series Pick‑and‑Place (PnP) Handlers support efficient IC testing and sorting under ambient and hot temperature conditions, with selected models offering full tri‑temperature capability (ambient, hot, and cold). Supporting 8‑site or 16‑site parallel testing, the Tube Series delivers flexible configurations and reliable performance for high‑volume production.
The Collie Series, featuring both FT and SLT Handlers, excels in single-station testing commonly utilized in laboratory settings for engineering new product development, reliability testing, and prototype or small batch production. With options for normal, high, and low-temperature models, the Collie series can be seamlessly integrated with ATE equipment to meet diverse testing
The Summit Series sets the benchmark for system-level semiconductor testing, offering unmatched flexibility and precision with its independent site connectivity and versatile temperature control options