NeoCEED
Innovating semiconductor testing, JHT Design shapes tomorrow's technology
Explore our cutting-edge integrated circuit test handlers designed to exceed industry standards. Discover how our advanced machines can elevate your semiconductor testing needs and shape the future of technology. Join us in pioneering excellence with JHT Semi Conductor Company Limited.
NEOCEED SERIES
P&P Tube Base Handler
The Neoceed Series redefines semiconductor testing with its cutting-edge technology and unparalleled performance, offering seamless integration and unmatched precision for system-level testing
The Neoceed Series represents the evolution of the Exceed 8000 platform, offering advanced capabilities tailored for tube Pick and Place (PnP) applications. This evolution ensures compatibility with modern manufacturing demands and sets new standards in tube handling efficiency.
Featuring a patented double boat design, the Neoceed Series optimizes throughput and efficiency with its unique ultra-fast shuttle arm. This design maximizes operational speed and minimizes motion time lag, ensuring swift and precise handling of components for seamless production processes.
The Neoceed Series incorporates a patented HIGH-speed picker pick and release mechanism, further enhancing its operational efficiency. This mechanism eliminates motion time lag, enabling rapid and precise component pick and release actions. This feature boosts productivity and minimizes production cycle times, making the Neoceed Series ideal for high-volume manufacturing environments.
Testing Excellence
The Neoceed series represents a pinnacle in test equipment innovation, offering unparalleled performance and versatility. Engineered with advanced features, including high-temperature capabilities and precise control mechanisms, this series sets a new standard for reliability and efficiency in pick and place testing. With a user-friendly interface and dual-display functionality, operators can effortlessly monitor and manage the testing process, ensuring simplicity and ease of use.Â
KEY FEATURES
Independent Site Connectivity
Simultaneously test multiple semiconductor devices for optimized throughput.
Versatile Temperature Control
Precisely manage temperature across various conditions for accurate testing.
Benchmark for System-Level Testing
Sets industry standards, providing comprehensive and reliable testing solutions.